Atomic force microscopy (AFM) is a versatile microscopic technology used for analyzing various samples at the nanoscale dimension. This analytical tool not only offers a three-dimensional image of the ...

This release is available in German. Jena (21 October 2010) Scientists from the Friedrich-Schiller-University Jena (Germany) were successful in improving a fabrication process for Atomic Force ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

The AFM is a safe instrument, but the user should observe general precautions prior to using the instrument. The system uses high voltages and currents of up to 165 V and 0.5 A, respectively. Make ...