Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...
PFM is based on the converse piezoelectric effect, where an applied electric field induces mechanical strain in piezoelectric materials. In PFM, an AC voltage is applied between a conductive atomic ...
The Nature Index 2025 Research Leaders — previously known as Annual Tables — reveal the leading institutions and countries/territories in the natural and health sciences, according to their output in ...
Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...
AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...
The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...
An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...
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