Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Carbon nanotube atomic force microscopy probes represent a significant advancement in nanoscale imaging and surface characterisation. Owing to the exceptional mechanical strength, high aspect ratio ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

Kelvin Probe Force Microscopy (KPFM) has emerged as a critical technique for the nanoscale investigation of electrical properties, enabling detailed mapping of surface potential and contact potential ...