Tanaka Precious Metal Technologies has developed TK-SR, a rhodium-based material for probe pins used in probe cards during semiconductor front-end testing. Save my User ID and Password Some ...

Photorelays can handle high heat in chip testing systems. They help testers, probe cards, and burn in equipment work safely.

FormFactor is experiencing strong growth in high-bandwidth memory (HBM) probe card demand, with HBM revenue nearly doubling in Q1 2024 compared to H2 2023. The company is benefiting from the increased ...

The report "Probe Pin Market by Pogo Type, Stamping Type, Spring Contact, Non-Spring Contact, Semiconductor Testing (Wafer-level Testing, and Package-level Testing), Frequency Range (<1 GHz, 1-10 GHz, ...

TANAKA Kikinzoku Kogyo K.K. (Head office: Chuo-ku, Tokyo; Representative Director & CEO: Koichiro Tanaka), which develops industrial precious metal products as one of the core companies of TANAKA ...

The rapid development of AI and high-performance computing (HPC) chips is providing long-term demand support for the ...

The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...

The types of devices being deployed in cars and how they differ in functionality. Why each device type requires a different test technique. Determining the best approach for the specific application.

TOKYO, Dec. 09, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced an integrated test cell designed to maximize die-level test ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

HBM4 test intensity boosts probe card replacement cycles; 2026 revenue +18.5% & margin upside. Click for more on FORM stock ...