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Researchers developed a method to enhance 3D imaging of lithium-ion battery electrodes, improving visualization of internal ...

Goethe University Frankfurt (Germany) ceremonially commissioned a state-of-the-art cryo plasma-FIB scanning electron microscope with nanomanipulator worth more than 5 million euros on Thursday. The ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...

Environmental Scanning Electron Microscopy (ESEM) represents a significant evolution of conventional scanning electron microscopy. By utilising variable pressure conditions rather than the high vacuum ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

Scanning electron microscopy (SEM), along with key analytical techniques, such as energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), are essential for advanced materials ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

Tim McCoy (right), the Smithsonian’s National Museum of Natural History curator of meteorites and the co-lead author on the new paper, with Cari Corrigan (left) sein a scanning electron microscopy lab ...