BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (NASDAQ: WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced that ...

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Designed to provide faster access to 3-D defect data and images, a new solution from FEI and PDF Solutions integrates PDF's Characterization Vehicle (CV) infrastructure and FEI's Defect Analyzer 300HP ...

With the aim of accelerating yield ramps of deep sub-micron semiconductors by speeding root cause analysis of defects to give better control over advanced processes, reduced time-to-market, and lower ...

The semiconductor industry is experiencing significant growth, and its proliferation has placed more urgency on the need to completely eliminate defects from the manufacturing chain. Currently, ...

Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical specificity with high-resolution imaging.

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...

Scientists see defects in potential new semiconductor Discovery could help in effort to make high-powered electronics more efficient Date: December 7, 2019 Source: Ohio State University Summary: A ...