BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (NASDAQ: WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced that ...
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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that interfere with electrical flow. A joint research team has developed a new ...
Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...
The latest studies using CRAIC Technologies’ microspectroscopy have delivered important insights into the characterization of semiconductors and other new materials. The advanced abilities of CRAIC ...
Designed to provide faster access to 3-D defect data and images, a new solution from FEI and PDF Solutions integrates PDF's Characterization Vehicle (CV) infrastructure and FEI's Defect Analyzer 300HP ...
With the aim of accelerating yield ramps of deep sub-micron semiconductors by speeding root cause analysis of defects to give better control over advanced processes, reduced time-to-market, and lower ...
Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical ...
The semiconductor industry is experiencing significant growth, and its proliferation has placed more urgency on the need to completely eliminate defects from the manufacturing chain. Currently, ...
Scientists see defects in potential new semiconductor Discovery could help in effort to make high-powered electronics more efficient Date: December 7, 2019 Source: Ohio State University Summary: A ...
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