The chip industry is conservative when it comes to adopting new metrology and inspection. Will it ultimately see NVD inspection as a wunderkind, or an also-ran? Remember when it first became obvious ...

What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

MILPITAS, Calif., July 20, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to ...

Several companies are developing or shipping next-generation e-beam inspection systems in an effort to reduce defects in advanced logic and memory chips. Vendors are taking two approaches with these ...

(MENAFN- PR Newswire) MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- TodayKLA Corporation (NASDAQ:KLAC ) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect ...

FEI Co. and KLA-Tencor Corp. today said they are teaming up to offer a system of defect inspection, review and analysis tools that incorporates both KLA-Tencor’s electron beam (e-beam) and FEI’s ...

“Our customers' need to quickly ramp processes that use complex patterning strategies creates defect challenges that drive our ongoing innovation in both optical and electron-beam technologies,” said ...